Muneda.com is hosted in Germany Muneda.com has HTTPS protocol. Number of used technologies: 2. First technologies Html, Php Number of used javascripts: 0. Number of used analytics tools: 0 Number of used plugins, modules: 0. Its server type is Apache/2.4.10.
IPV4 Encoding (Ip2long) | 2420934712 |
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Binary IP address | 10010000010011001000100000111000 |
Octal IP address | 22023104070 |
Hexadecimal IP address | 904c8838 |
Domain name length | 10 |
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Hyphens | Domain doesn't contain hyphens! |
Domain name with Hindi letters: | म उ ञ ए द अ . च ओ म |
Domain name with Hebrew letters: | מ (u) נ (e) ד (a) . ק(c) (ο) מ |
Domain name with Cyrillic letters: | м у н e д a . ц о м |
Domain name with Arabic letters: | ﻡ (u) ﻥ (e) ﺩ ﺍ . (c) (o) ﻡ |
Domain name with Greek letters: | μ υ ν ε δ α . χ ο μ |
Domain name with Chinese letters: | 艾马 伊吾 艾娜 伊 迪 诶 . 西 哦 艾马 |
Domain without Consonants: | mnd.cm |
Domain without Vowels: | uea.o |
Alphabet positions: | m13 u21 n14 e5 d4 a1 . c3 o15 m13 |
Domain name pattern: V: Vowel, C: Consonant, N: Number |
C V C V C V . C V C |
MunEDA's products and solutions enable customers to reduce the design times of their circuits and to maximize robustness, reliability and yield. MunEDA's solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics.
Application Areas, AMS, IP Libraries, IP Porting, Memory, RF, Applications, Audio/Video Signal Processing, Automotive and Industrial ICs, DRAM, Embedded Memory, FLASH, FPGA, Horizontal Porting, Initial Design (low voltage), IP Reuse & Performance Tuning, Low Power / Low Voltage Design Challenges, Non-RF blocks in Communication Circuits, Optimization for noise, power, S-parameters, area, Optimization of precision transient signals, Performance Optimization & Modeling, Performance Specification Retargeting, Process Migration, Reduce Sensitivities to Operating Conditions, Reduce Sensitivities to Process Variations, Reduction of Area, Power & Consumption, Reduction of sensitivities to operating conditions and process variations, RF blocks in wireless communication circuits, Robustness & Yield Optimization, Sensor Interfaces, Sizing - Automate Sizing for IP Reuse and process technology (pdk) updates, Sizing for speed, robustness, area, leakage, SRAM, Standard I/O cells, I/O macro cells, and analog libraries, Statistical Variation & Corner Analysis, Technology Migration, Vertical Porting, Circuit Class, Active Bypass Filter, ADC Analog-Digital Converter, Adiabatic Logic Gates, Bandgap, Bandgap Reference, Bandgap Voltage References, Blu-ray Disc Photodetector ICs, Buffer, Buffer Chain, Bypass Filter, Cascode Gain Stages, CCO Current Controlled Oscillator, Charge Pump, Clock Buffer, CML Converter, Comparator, Comparator for Switched Capacitor Circuits, Converter, CPPLL Charge Pump Phased Locked Loop, Current Mirror, Current Source, DAC Digital-Analog Converter, Decoder, Delay Line, Detector, Differential Amplifier, Digital Buffer, Equalizer, Error Amplifier, Ethernet Switch, Filter, Folded-Cascode Operational Amplifier, High-Voltage Amplifier, Impedance Control Circuit, IP Cell, Latch, Level Shifter, LIN transceiver, Linear Voltage Regulator (LDO), Low Noise Amplifiers (LNA), Low Power Operational Amplifier, Low Voltage Amplifier, LVDS Drivers, Memory Cell, Miller Operational Amplifier, Mixer, Multiplexer, Operational Amplifier, Oscillator, PCIe Equalizer, Pipeline A/D Converter, PLL, PLL Phased Locked Loop, POR Power-on-reset, Receiver, Receiver Path, RF Circuits, RF Input Amplifier, RF Receiver, RF Transceiver, RF Transmitter, Ring Oscillator, Sample & Hold Stage, Sense Amplifier, Serializer/Deserializer (SerDes), Short/Overload Detector, Single-Stage Amplifier, Sub-block of ADC/DAC, TIA Transimpedance Amplifier, Timer, Transceiver, Transmitter, VCO Voltage Controlled Oscillator, Voltage Level Detector, Voltage Regulator, Voltage Source, Industry, 130nm, 180nm, 1µm, 20nm, 22nm, 250nm, 28nm, 32nm, 350nm, 40nm, 45nm, 500nm, 55nm, 600nm, 65nm, 90nm, BCD, BICMOS, Bipolar, CMOS, DMOS, SOI, Typical Performance Metrics, Accuracy, Delays, Duty Cycle, Eye Diagram Opening, Frequency, Gain, Glitch, IP3, Jitter, Leakage current, Linearity (harmonic distortion), Load, Noise Figure, Offset, Performance Dependencies, Phase Margin, Pin-to-pin skew, Power, Power Consumption, Process Sensitivities, PSRR, Slew Rate, Static Noise Margin, Statistical Variations, Supply Voltage, Temperature and Operating Range, Temperature Stability, Voltage Levels, Write Time
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